CISCEM 2018 - 4th International Conference on In-Situ and Correlative Electron Microscopy

CISCEM aims at bringing together an interdisciplinary group of scientists from the fields of biology, materials science, chemistry, and physics, to discuss future directions of in-situ electron microscopy research. Topics will include nanoscale studies of biological samples, and functional materials under realistic or near realistic conditions, for example, in gaseous environments, at elevated temperatures, and in liquid. It will be discussed how dynamical processes can be studied by including the time domain in electron microscopy, while taking into account the electron beam effects. CISCEM is also open to other in-situ techniques, such as light microscopy, X-ray, near field or scanning probe microscopy, with the view to stimulate fruitful discussions on multi-scale and correlative approaches.

KEYNOTE SPEAKER

  • Prof. Bob Sinclair, Stanford University, USA


INVITED SPEAKERS

  • Prof. Lawrence F. Allard, Oak Ridge National Laboratory, USA
  • Prof. Nigel Browning, University of Liverpool, UK
  • Dr. Lucy Collinson, The Francis Crick Institute, UK
  • Dr.-Ing. Tim Dahmen, German Research Center for Artificial Intelligence, Saarbrücken, Germany
  • Dr. Indra Navina Dahmke, INM – Leibniz Institute for New Materials, Germany
  • Dr. Radostin Danev, University of Tokyo, Japan
  • Dr. Arnaud Demortière, CNRS / Université de Picardie Jules Verne, France
  • Prof. Achilleas Frangakis, Johann Wolfgang Goethe University Frankfurt, Germany
  • Dr. Sarah Haigh, University of Manchester, UK
  • Dr. Stig Helveg, Haldor Topsøe, Denmark
  • Prof. R. J. Dwayne Miller, Max Planck Institute for the Structure and Dynamics of Matter, Germany
  • Ass. Prof. Jaysen Nelayah, CNRS / Diderot University, Paris, France
  • Dr. Joe Patterson, Eindhoven University of Technology, Netherlands
  • Prof. Erdmann Spiecker, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
  • Ass. Prof. Taylor Woehl, University of Maryland, USA


 

For further information please see: www.ciscem2018.de